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Incavo's Spring Probe Pin
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Pin diameters in production 0.08 ~ 1.00mm
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Wafer and packaged Test
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Ansys HFSS testing for signal integrity performance
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All Pins undergo electrical and mechanical testing
F Type
Barrel-less Spring Probe




F Type -
Barrel-less Spring Probe
Key Features:
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High current capacity
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Available in machined, hybrid (machined-stamped), and stamped construction
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Open structure allows easier cleaning of debris, oxidation, and plating particles
Pin design capable of combining a wide range of materials and platings to enhance mechanical, thermal, and chemical durability
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