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Incavo's Spring Probe Pin
 

  • Pin diameters in production 0.08 ~ 1.00mm
     

  • Wafer and packaged Test
     

  • Ansys HFSS testing for signal integrity performance
     

  • All Pins undergo electrical and mechanical testing

F Type 
Barrel-less Spring Probe

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F Type -
Barrel-less Spring Probe

Key Features:

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  • High current capacity

  • Available in machined, hybrid (machined-stamped), and stamped construction

  • Open structure allows easier cleaning of debris, oxidation, and plating particles

Pin design capable of combining a wide range of materials and platings to enhance mechanical, thermal, and chemical durability

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