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Incavo's Spring Probe Pin
 

  • Pin diameters in production 0.08 ~ 1.00mm
     

  • Wafer and packaged Test
     

  • Ansys HFSS testing for signal integrity performance
     

  • All Pins undergo electrical and mechanical testing

C Type 
Single Ended Spring Probe

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C Type -
Single Ended Spring Probe

Key Features:

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  • Single plunger moves with the spring

  • Fewer mechanical electrical junctions in the signal path limits the opportunities for resistive loss

  • Typically the mechanical junction (ie moving plunger) is on the PCB side, which reduces the possibility of debris and contaminants enter from the device side (higher risk)

Pin design capable of combining a wide range of materials and platings to enhance mechanical, thermal, and chemical durability

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